Understanding Semiconductors: Modern Metrology from Lab to Fab
Rigaku
14 episodes
9 months ago
Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.
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Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.
Professor Alain Diebold, Ph.D. Successes at SEMATECH, Effective Approach to Metrology Challenges, and Key Takeaways from this 2022 FCMN Conf
Understanding Semiconductors: Modern Metrology from Lab to Fab
40 minutes
3 years ago
Professor Alain Diebold, Ph.D. Successes at SEMATECH, Effective Approach to Metrology Challenges, and Key Takeaways from this 2022 FCMN Conf
In Today’s episode, Markus speaks with Alain Diebold, Ph.D. Dr. Diebold is the Empire Innovation Professor Emeritus of Nanoscale Science at SUNY Polytechnic Institute in Albany New York In This Episode, they speak about: Was there a distinction between lab and fab in early incarnations of Metrology? Success Stories from Alain’s Relationship with SEMATECH How to address the “Valley of Death” between a well-nurtured academic idea and an actual product What is an effective way to approach future metrology challenges? The Purpose and “why” behind the 2022 Frontiers of Characterization and Metrology for Nanoelectronics Conference. (FCMN)Alain’s main Takeaways from the most recent conference
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Understanding Semiconductors: Modern Metrology from Lab to Fab
Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.
