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Understanding Semiconductors: Modern Metrology from Lab to Fab
Rigaku
14 episodes
9 months ago
Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.

Welcome to Understanding Semiconductors!
Show more...
Technology
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All content for Understanding Semiconductors: Modern Metrology from Lab to Fab is the property of Rigaku and is served directly from their servers with no modification, redirects, or rehosting. The podcast is not affiliated with or endorsed by Podjoint in any way.
Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.

Welcome to Understanding Semiconductors!
Show more...
Technology
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Increased Metrology Means Increased Data. So what Do We Do With It? w/ Alex Liddle - Scientific Director at NIST
Understanding Semiconductors: Modern Metrology from Lab to Fab
56 minutes
3 years ago
Increased Metrology Means Increased Data. So what Do We Do With It? w/ Alex Liddle - Scientific Director at NIST
The National Institute of Standards and Technology (NIST) is a physical sciences laboratory and non-regulatory agency of the United States Department of Commerce. NIST's activities are organized into laboratory programs that include nanoscale science and technology, engineering, information technology, neutron research, material measurement, and physical measurement.
In today’s episode Markus speaks with Alex Liddle, Scientific Director at NIST.
They discuss:
Alex’s Career Journey to NIST
Dimensional Metrology
The Measurement of a Test Structure vs. the Actual Structure and CoverageThe trend to measure everything you can across the wafer

Key Trends Alex noticed at this years Frontiers conference
Stochastic Failures, Lithography and Reliability 


Reach out to Markus for any potential guest requests or episode ideas here: https://www.linkedin.com/in/markus-kuhn-4b502110/
For the latest in new Metrology Techniques and Solutions check out https://rsmd.rigaku.com/
To make sure you never miss an episode of Understanding Semiconductors, subscribe on Apple Podcasts, Spotify, and the website.
Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.
Understanding Semiconductors: Modern Metrology from Lab to Fab
Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.

Welcome to Understanding Semiconductors!