Understanding Semiconductors: Modern Metrology from Lab to Fab
Rigaku
14 episodes
9 months ago
Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.
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Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.
Get to know Semiconductors with Chris Miller, author of the best-selling book, Chip War
Understanding Semiconductors: Modern Metrology from Lab to Fab
30 minutes
2 years ago
Get to know Semiconductors with Chris Miller, author of the best-selling book, Chip War
Join Markus Kuhn for this episode of Understanding Semiconductors with Chris Miller, the historian behind Chip War: The Fight For the World's Most Critical Technology. This conversation delves deep into the world of semiconductors as these two experts dissect how technology, geopolitics, supply chain, and resources play a role in semiconductor development and manufacturing. Reach out to the host, Markus Kuhn, with potential guest requests or episode ideas on LinkedIn Markus Kuhn - Senior Director of Semiconductor Metrology and Fellow - Rigaku | LinkedIn For the latest in new Metrology Techniques and Solutions, visit Rigaku Semiconductor Metrology Division Never miss an episode of Understanding Semiconductors, subscribe on Apple Podcasts, Spotify, and Google Podcasts. Just search for Understanding Semiconductors in your favorite podcast player.
Understanding Semiconductors: Modern Metrology from Lab to Fab
Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.